ShengHe Refractories Products



Download Product Catalogue

Perfect From Every Aspect


Field emission scanning electron microscopy (FESEM) provides topographical and elemental information atmagnifications of 10x to 300,000x, with virtually unlimited depth of field.

In Sheng He, we uses FESEM to analysis the microspoic microstructure of incoming raw material.

XRF Analyzer

XRF is an X-ray spectrometric technique for elementaanalysis of a wide variety of materials. In Sheng He, XRF is used to analysis the chemical composition of refractory materials.
MgO, Al2O3, SiO2, Fe2O3, Cr2O3, CaO, Na2O

Test sample: Al203 99.65%, and all other minority contents of minerals

Test sample: Al203 77.89%, MgO 20.98% and other minority contents of minerals

XRD Analyzer

XRD X-ray powder diffraction (XRD) is a rapid analytical technique primarily used for phase identification of a crystalline material and can provide information on unit cell dimensions. The analyzed material is finely ground, homogenized, and average bulk composition is determined.
XRD is being used as to determined the mineral phase of the raw material

Contact our sale person for more information

Contact Us