ShengHe Refractories Products
EAF REFRACTORY
LADLE REFRACTORY
INDUCTION FURNACE
TUNDISH REFRACTORY
HIGH QUALITY STANDARD
Perfect From Every Aspect
FESEM
Field emission scanning electron microscopy (FESEM) provides topographical and elemental information atmagnifications of 10x to 300,000x, with virtually unlimited depth of field.
In Sheng He, we uses FESEM to analysis the microspoic microstructure of incoming raw material.
XRF Analyzer
XRF is an X-ray spectrometric technique for elementaanalysis of a wide variety of materials. In Sheng He, XRF is used to analysis the chemical composition of refractory materials.
MgO, Al2O3, SiO2, Fe2O3, Cr2O3, CaO, Na2O
Test sample: Al203 99.65%, and all other minority contents of minerals
Test sample: Al203 77.89%, MgO 20.98% and other minority contents of minerals
XRD Analyzer
XRD X-ray powder diffraction (XRD) is a rapid analytical technique primarily used for phase identification of a crystalline material and can provide information on unit cell dimensions. The analyzed material is finely ground, homogenized, and average bulk composition is determined.
XRD is being used as to determined the mineral phase of the raw material
